The writer got a bit confused at the tail end of section 9.
You may get partly functional dies if, for instance, 3 out of 4 cores in a single die (=chip) work. And besides functional testing, you may also have performance 'binning' (some parts hit higher speeds, etc.)
The writer got a bit confused at the tail end of section 9. You may get partly functional dies if, for instance, 3 out of 4 cores in a single die (=chip) work. And besides functional testing, you may also have performance 'binning' (some parts hit higher speeds, etc.)